Recent Opportunities

• Neuromorphic (Brain-Inspired Computing)
  • Deep Learning for image classification
  • Unsupervised Learning using Charge-trap transistors (CTT)
• Fabrication Process Simulations
• Characterization, Measurements, & Reliability Testing
  • Characterizing & Reliability Tests for Si-Interconnect Fabric (Si-IF)
  • Characterizing & Mechanical Stress Testing for Flextrate™

Application

Application: click here

Deadline: There is no application deadline, but we encourage applying early in the quarter.
[note: you must have a valid g.ucla.edu account in order to access the application]

Questions? Contact us at uclachips@g.ucla.edu.