- Neuromorphic (Brain-Inspired Computing)
- Deep Learning for image classification
- Unsupervised Learning using Charge-trap transistors (CTT)
- Fabrication Process Simulations
- Characterization, Measurements, & Reliability Testing
- Characterizing & Reliability Tests for Si-Interconnect Fabric (Si-IF)
- Characterizing & Mechanical Stress Testing for Flextrate™
Application: click here
Deadline: There is no application deadline, but we encourage applying early in the quarter.
[note: you must have a valid g.ucla.edu account in order to access the application]
Questions? Contact us at email@example.com.